[1] X.Tang,A.Xu,andS.Niu, ‘‘KKCV-GA-based method foroptimal analog test point selection,’’IEEETrans.Instrum.Meas.,vol.66,no.1,pp.24–32, Jan. 2017.
[ 2 ] Y . Y u , Y . J i a n g , a n d X . P e n g ,‘‘M u l t i -frequencytestgenerationforincipient faults in analog cir-cuits based on the aliasing measuring model,’’ IEEE Access,vol. 6, pp. 34724–34735, 2018.
[3] Z.LongfuandS.Yibin, ‘‘A novel method of single faultdiagnosis in linear resistive circuit based on slope,’’presented at the Int. Conf. Commun., Circuits Syst., 2008.
[4] S.Tian,C.Yang,F.Chen,andZ.Liu, ‘‘Circleequation-based fault model in gmethod for linear analogcircuits,’’IEEETrans.Instrum.Meas.,vol.63, no. 9, pp. 2145 –2159,Sep. 2014.
[5] M.TadeusiewiczandS.Ha?gas, ‘‘A method for multiplesoft fault diagnosis of linear analog circuits,’’Measurement,vol.131,pp.714–722,Jan.2019.
